• DocumentCode
    967449
  • Title

    Direct measurements of 4I11/2 terminal-level lifetime in Nd:YLF

  • Author

    Zuegel, Jonathan D. ; Seka, Wolf

  • Author_Institution
    Lab. for Laser Energetics, Rochester Univ., NY, USA
  • Volume
    31
  • Issue
    10
  • fYear
    1995
  • fDate
    10/1/1995 12:00:00 AM
  • Firstpage
    1742
  • Lastpage
    1746
  • Abstract
    Direct measurements of the 4I11/2 terminal-laser-level lifetime of Nd:YLF after saturating a pumped sample with an impulse-like pulse are reported. Measurements of small-signal gain recovery at the 1047- and 1053-nm laser wavelengths in four different samples, as well as transient excited-state absorption from the terminal laser level, provide consistent values for this lifetime that average 21.6 ns with subnanosecond accuracy
  • Keywords
    excited states; high-speed optical techniques; laser variables measurement; lithium compounds; neodymium; optical pumping; optical saturation; radiative lifetimes; solid lasers; 1047 nm; 1053 nm; 21.6 ns; 4I11/2 terminal-level lifetime; LiYF4:Nd; Nd:YLF laser; YLF:Nd; direct measurements; impulse-like pulse; laser saturation; lifetime; pumped sample saturation; small-signal gain recovery; subnanosecond accuracy; terminal laser level; terminal-laser-level lifetime; transient excited-state absorption; Absorption; Energy states; Neodymium; Optical materials; Optical pulse shaping; Phonons; Pulse amplifiers; Pulse measurements; Pump lasers; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.466047
  • Filename
    466047
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=967449