DocumentCode :
967513
Title :
The Transient Effect in Capacitor Leakage Resistance Measurements
Author :
France, Raymond W.
Author_Institution :
Hughes Aircraft Co.
Volume :
7
Issue :
3
fYear :
1960
fDate :
9/1/1960 12:00:00 AM
Firstpage :
106
Lastpage :
112
Abstract :
Summary--The leakage resistance of capacitors as a function of time is a characteristic to be considered in the choice and control of capacitors, especially in many modern military electronics applications. This paper, by the use of transient circuit analysis, shows why most leakage resistance data accumulated in the electronics industry for capacitors are invalid. Valid data can be obtained by using low resistance meters to make such measurements. Valid experimental curves of leakage resistance vs time for thirteen types of capacitors, each type employing a different dielectric combination, are shown; and the significance of these curves is discussed.
Keywords :
Capacitors; Dielectric measurements; Dielectrics and electrical insulation; Electrical capacitance tomography; Electrical resistance measurement; Electronics industry; Equivalent circuits; Instruments; Leakage current; Temperature measurement;
fLanguage :
English
Journal_Title :
Component Parts, IRE Transactions on
Publisher :
ieee
ISSN :
0096-2422
Type :
jour
DOI :
10.1109/TCP.1960.1136453
Filename :
1136453
Link To Document :
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