DocumentCode :
967603
Title :
A comparative study of temperature sensitivity of InGaAsP and AlGaAs MQW lasers using numerical simulations
Author :
Li, Z.M. ; Bradford, T.
Author_Institution :
Inst. for Microstructural Sci., Nat. Res. Council of Canada, Ottawa, Ont., Canada
Volume :
31
Issue :
10
fYear :
1995
fDate :
10/1/1995 12:00:00 AM
Firstpage :
1841
Lastpage :
1847
Abstract :
We used numerical simulation to compare the temperature sensitivity of an InGaAsP MQW laser emitting at 1.55 μm and an AlGaAs MQW laser at 0.82 μm. By artificially changing the InGaAsP laser gradually into a structure similar to the AlGaAs laser, we gained quantitative insight into how each material or structural parameter causes the relatively low T0 of the InGaAsP MQW laser. Using a typical MQW structure we demonstrated the relative importance of parameters involving Auger recombination, current leakage over the quantum barrier, optical confinement and band offset. We found that if these parameters were made the same as the AlGaAs laser, the T0 of the InGaAsP laser was even better than that of the AlGaAs laser. Our numerical simulation confirmed that the Auger recombination is the main cause of low T0 in MQW InGaAsP lasers. We also discovered that thermal current leakage over the barrier and Auger recombinations are correlated with each other and both factors must be improved to increase the T0 of InGaAsP lasers to that of AlGaAs lasers
Keywords :
Auger effect; III-V semiconductors; aluminium compounds; electron-hole recombination; gallium arsenide; indium compounds; laser theory; laser transitions; quantum well lasers; semiconductor device models; 0.82 mum; 1.55 mum; AlGaAs; AlGaAs MQW lasers; Auger recombination; InGaAsP; InGaAsP MQW lasers; band offset; current leakage; numerical simulations; optical confinement; quantum barrier; structural parameter; temperature sensitivity; thermal current leakage; Charge carrier density; Electron optics; Numerical simulation; Optical materials; Optical sensors; Quantum well devices; Radiative recombination; Temperature dependence; Temperature sensors; Threshold current;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.466060
Filename :
466060
Link To Document :
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