Title :
Deriving stability criteria for nonlinear circuits with application to worst-case noise margin of I2L
Author_Institution :
Council for Scientific and Industrial Research, National Electrical Engineering Research Institute, Pretoria, South Africa
Abstract :
A simplified method of deriving stability criteria for nonlinear circuits is introduced. Unlike the conventional approach which requires construction of a small-signal equivalent circuit and identification of loops, only the basic nonlinear circuit equations are needed. The method is applied to the calculation of the worst-case static noise margin of I2L, which is shown to be much smaller than a recently published result.
Keywords :
integrated injection logic; noise; nonlinear network analysis; stability; I2L; nonlinear circuits; stability criteria; worst case noise margin;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19800619