• DocumentCode
    967645
  • Title

    Deriving stability criteria for nonlinear circuits with application to worst-case noise margin of I2L

  • Author

    Seevinck, E.

  • Author_Institution
    Council for Scientific and Industrial Research, National Electrical Engineering Research Institute, Pretoria, South Africa
  • Volume
    16
  • Issue
    23
  • fYear
    1980
  • Firstpage
    867
  • Lastpage
    869
  • Abstract
    A simplified method of deriving stability criteria for nonlinear circuits is introduced. Unlike the conventional approach which requires construction of a small-signal equivalent circuit and identification of loops, only the basic nonlinear circuit equations are needed. The method is applied to the calculation of the worst-case static noise margin of I2L, which is shown to be much smaller than a recently published result.
  • Keywords
    integrated injection logic; noise; nonlinear network analysis; stability; I2L; nonlinear circuits; stability criteria; worst case noise margin;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19800619
  • Filename
    4245392