• DocumentCode
    967829
  • Title

    Wear Resistance Characterization for Plated Connectors

  • Author

    Graham, Arthur H.

  • Author_Institution
    E. I. du Pont de Nemours & Co., Inc., Wilmington, DE, USA
  • Volume
    8
  • Issue
    1
  • fYear
    1985
  • fDate
    3/1/1985 12:00:00 AM
  • Firstpage
    142
  • Lastpage
    147
  • Abstract
    The wear resistance of connectors plated with precious metal and precious metal alloy systems is characterized under conditions of high normal load (300 g) in tests ranging from !00 to 25 000 mating cycles. Contact resistance measurements and optical microscopy as well as the surface analytical techniques of Auger electron spectroscopy and · , .. . energy-dispersive X-ray analysis are utilized in the characterization of wear test performance. The wear life in terms of satisfactory connector performance is investigated. The results indicated that the electrical, chemical, and mechanical integrity of a coating system consisting of a palladium-nickel alloy PlUs a thin gold overcoat remained esentially unchanged through 25 000 mating cycles, A conventional electrodeposited hard gold system wore out after 2000 to 3000 mating cycles.
  • Keywords
    Connectors; Contacts, mechanical factors; Gold materials/devices; Palladium materials/devices; Connectors; Contact resistance; Electrical resistance measurement; Electron microscopy; Electron optics; Gold; Optical microscopy; Spectroscopy; Surface resistance; System testing;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1985.1136487
  • Filename
    1136487