DocumentCode :
967829
Title :
Wear Resistance Characterization for Plated Connectors
Author :
Graham, Arthur H.
Author_Institution :
E. I. du Pont de Nemours & Co., Inc., Wilmington, DE, USA
Volume :
8
Issue :
1
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
142
Lastpage :
147
Abstract :
The wear resistance of connectors plated with precious metal and precious metal alloy systems is characterized under conditions of high normal load (300 g) in tests ranging from !00 to 25 000 mating cycles. Contact resistance measurements and optical microscopy as well as the surface analytical techniques of Auger electron spectroscopy and · , .. . energy-dispersive X-ray analysis are utilized in the characterization of wear test performance. The wear life in terms of satisfactory connector performance is investigated. The results indicated that the electrical, chemical, and mechanical integrity of a coating system consisting of a palladium-nickel alloy PlUs a thin gold overcoat remained esentially unchanged through 25 000 mating cycles, A conventional electrodeposited hard gold system wore out after 2000 to 3000 mating cycles.
Keywords :
Connectors; Contacts, mechanical factors; Gold materials/devices; Palladium materials/devices; Connectors; Contact resistance; Electrical resistance measurement; Electron microscopy; Electron optics; Gold; Optical microscopy; Spectroscopy; Surface resistance; System testing;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1985.1136487
Filename :
1136487
Link To Document :
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