• DocumentCode
    967875
  • Title

    Extrinsic photoconductivity in platinum-doped silicon

  • Author

    Bickley, W.P. ; Eddolls, D.V. ; Maher, E.F.

  • Author_Institution
    Plessey Research (Caswell) Ltd., Allen Clark Research Centre, Towcester, UK
  • Volume
    16
  • Issue
    23
  • fYear
    1980
  • Firstpage
    898
  • Lastpage
    899
  • Abstract
    Both n- and p-type silicon have been doped with platinum and characterised by measurement of carrier concentration profile, resistivity/temperature, Hall mobility and conductivity measurements. It is concluded that photoconductivity is limited by recombination at uncompensated platinum centres in heavily doped material, and at 100 K by trapping at shallow levels.
  • Keywords
    elemental semiconductors; heavily doped semiconductors; photoconductivity; platinum; silicon; Hall mobility; Si:Pt; carrier concentration profile; conductivity; extrinsic photoconductivity; heavily doped material; recombination; trapping at shallow levels; uncompensated Pt centres;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19800640
  • Filename
    4245413