Title :
Design for testability—A survey
Author :
Williams, Thomas W. ; Parker, Kenneth P.
Author_Institution :
IBM, General Technology Division, Boulder, CO
Abstract :
This paper discusses the basics of design for testability. A short review of testing is given along with some reasons why one should test. The different techniques of design for testability are discussed in detail. These include techniques which can be applied to today´s technologies and techniques which have been recently introduced and will soon appear in new designs.
Keywords :
Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Costs; Design for testability; Large scale integration; Manufacturing industries; Sequential analysis; Very large scale integration;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1983.12531
