• DocumentCode
    968049
  • Title

    How to Calculate the True Permissible Leak Rate and How to Raise it by Four Orders of Magnitude

  • Author

    Davy, J. Gordon

  • Author_Institution
    Westinghouse Manufacturing Systems and Technology Center, Columbia, MD, USA
  • Volume
    8
  • Issue
    3
  • fYear
    1985
  • fDate
    9/1/1985 12:00:00 AM
  • Firstpage
    359
  • Lastpage
    365
  • Abstract
    This paper is in two parts. The first part presents bad news and the second part good news. The bad news is that the maximum permissible leak rates specified in the military standards are too large by at least three orders of magnitude, and that for microelectronic packages the true values are too small to measure. The good news is that the true permissible leak rate can be raised by four orders of magnitude or more by the inclusion in the package of a means to capture water as it enters through small leaks. Three different means are presented.
  • Keywords
    Integrated circuit packaging; Moisture control; Capacitors; Cooling; Gases; Humidity; Microelectronics; Military standards; Moisture measurement; Semiconductor device packaging; Semiconductor devices; Temperature;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1985.1136507
  • Filename
    1136507