DocumentCode
968049
Title
How to Calculate the True Permissible Leak Rate and How to Raise it by Four Orders of Magnitude
Author
Davy, J. Gordon
Author_Institution
Westinghouse Manufacturing Systems and Technology Center, Columbia, MD, USA
Volume
8
Issue
3
fYear
1985
fDate
9/1/1985 12:00:00 AM
Firstpage
359
Lastpage
365
Abstract
This paper is in two parts. The first part presents bad news and the second part good news. The bad news is that the maximum permissible leak rates specified in the military standards are too large by at least three orders of magnitude, and that for microelectronic packages the true values are too small to measure. The good news is that the true permissible leak rate can be raised by four orders of magnitude or more by the inclusion in the package of a means to capture water as it enters through small leaks. Three different means are presented.
Keywords
Integrated circuit packaging; Moisture control; Capacitors; Cooling; Gases; Humidity; Microelectronics; Military standards; Moisture measurement; Semiconductor device packaging; Semiconductor devices; Temperature;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1985.1136507
Filename
1136507
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