DocumentCode :
968049
Title :
How to Calculate the True Permissible Leak Rate and How to Raise it by Four Orders of Magnitude
Author :
Davy, J. Gordon
Author_Institution :
Westinghouse Manufacturing Systems and Technology Center, Columbia, MD, USA
Volume :
8
Issue :
3
fYear :
1985
fDate :
9/1/1985 12:00:00 AM
Firstpage :
359
Lastpage :
365
Abstract :
This paper is in two parts. The first part presents bad news and the second part good news. The bad news is that the maximum permissible leak rates specified in the military standards are too large by at least three orders of magnitude, and that for microelectronic packages the true values are too small to measure. The good news is that the true permissible leak rate can be raised by four orders of magnitude or more by the inclusion in the package of a means to capture water as it enters through small leaks. Three different means are presented.
Keywords :
Integrated circuit packaging; Moisture control; Capacitors; Cooling; Gases; Humidity; Microelectronics; Military standards; Moisture measurement; Semiconductor device packaging; Semiconductor devices; Temperature;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1985.1136507
Filename :
1136507
Link To Document :
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