• DocumentCode
    968052
  • Title

    Nonlinear yield analysis and optimization of monolithic microwave integrated circuits

  • Author

    D´Agostino, Stefano ; Paoloni, Claudio

  • Author_Institution
    Dipartimento di Ingegneria Elettronica, La Sapienza Univ., Rome, Italy
  • Volume
    43
  • Issue
    10
  • fYear
    1995
  • fDate
    10/1/1995 12:00:00 AM
  • Firstpage
    2504
  • Lastpage
    2507
  • Abstract
    In this paper, a discussion about nonlinear yield evaluation and nonlinear yield optimization of MMIC circuits using a physics-based nonlinear lumped-element MESFET model is presented. The lumped elements of the MESFET model are directly calculated by closed expressions related to process parameters. One of the main features of the model is the easy and effective implementation in commercial CAD tools. It allows the use of nonlinear yield algorithms assuming, as statistical variables, the parameters of the technological process, such as: doping density, gate channel length, etc., maintaining at the same time, the advantages of lumped-element MESFET model, in particular fast computation and reduction of convergence problems in harmonic balance for complex circuit topologies
  • Keywords
    Schottky gate field effect transistors; circuit optimisation; equivalent circuits; field effect MMIC; integrated circuit modelling; integrated circuit yield; semiconductor device models; MMIC circuits; commercial CAD tools; complex circuit topologies; convergence; doping density; gate channel length; harmonic balance; lumped-element MESFET model; monolithic microwave integrated circuits; nonlinear yield algorithms; nonlinear yield analysis; physics-based nonlinear MESFET model; statistical variables; yield optimization; Dielectric substrates; Integrated circuit modeling; Integrated circuit yield; MESFET circuits; MESFET integrated circuits; MMICs; Microwave integrated circuits; Monolithic integrated circuits; Performance analysis; Semiconductor process modeling;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.466189
  • Filename
    466189