• DocumentCode
    968120
  • Title

    Rapid Evaluation Methods for Thick-Film Multilayer Conductor Systems for Hybrid Microcircuits

  • Author

    Sutherland, Robert R. ; Videlo, Ian D E ; Chwastek, Edward J.

  • Author_Institution
    Martlesham Heath, Ipswich, England
  • Volume
    8
  • Issue
    3
  • fYear
    1985
  • fDate
    9/1/1985 12:00:00 AM
  • Firstpage
    321
  • Lastpage
    327
  • Abstract
    Palladium-silver and copper thick-film conductors are now being widely used instead of gold in the fabrication of multilayer hybrid microcircuits, with a possible consequent increase in the risk of conductor crossover failure. Because of the potentially very large number of thickfilm material combinations available for the construction of such crossovers, evaluation methods more rapid than the 85°C/85 percent relative humidity (RH) test (currently used by British Telecom) have been investigated. A measurement of insulation resistance made after boiling in salt water and drying has been found to correlate with the results of an 85°C/85 percent RH test. A room temperature insolation resistance greater than about 3 x 1011 \\Omega cm2 indicates a suitable materials combination for Pd/Ag crossover systems, while a somewhat lower value may be acceptable for copper. Measurements at high temperatures of insulation resistance and time-to-failure under bias did not, however, correlate with the 85°C/85 percent RH results and were only useful for predicting time-to-failure under dry conditions.
  • Keywords
    Copper materials/devices; Palladium materials/devices; Silver materials/devices; Thick-film circuit interconnections; Thick-film circuit reliability; Conducting materials; Conductors; Copper; Electrical resistance measurement; Fabrication; Gold; Hybrid integrated circuits; Insulation; Nonhomogeneous media; Temperature measurement;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1985.1136514
  • Filename
    1136514