DocumentCode :
968269
Title :
Solder Pad Geometry Studies for Surface Mount of Chip Capacitors
Author :
Kress, Elizabeth A.
Author_Institution :
AVX Corp., Myrtle Beach, SC
Volume :
8
Issue :
4
fYear :
1985
fDate :
12/1/1985 12:00:00 AM
Firstpage :
505
Lastpage :
511
Abstract :
An optimized solder pad geometry for surface mounting chip capacitors is developed. In surface mount production poor design can cause low yields and may require expensive redesign, retooling, and reprogramming of equipment. The solder fillets were examined visually for three types of defects. The general procedure used was to surface mount capacitors onto epoxy and alumina substrates using vapor phase reflow and infrared reflow. The solder used was 60Sn/40 Pb. Capacitors used were palladium/silver frit terminated (five-sided termination) and thin-film terminated (end termination only). Visual defects observed as a function of solder pad geometry were opens, misalignment Of chips (rotation), and drawbridges. Geometry of the solder pads was seen to play an important role in the visual defects observed. Of particular importance were the overlap of the pad and the capacitor, the width of solder pads, and the extension of the solder pad outside the capacitor (in the length dimension). Capacitor sizes used were 0805, 1206, and 1210 components.
Keywords :
Capacitors; Integrated circuit bonding; Capacitors; Information geometry; Manufacturing; Palladium; Production; Silver; Soldering; Substrates; Testing; Transistors;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1985.1136529
Filename :
1136529
Link To Document :
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