• DocumentCode
    968289
  • Title

    High-Reliability Solder Connection for ZIF Connectors

  • Author

    Hashimoto, Kaoru ; Horikoshi, Eiji ; Sato, Takehiko ; Niwa, Koichi ; Henmi, Zenzo

  • Author_Institution
    Fujitsu Labs Ltd., Atsugi, Japan
  • Volume
    8
  • Issue
    4
  • fYear
    1985
  • fDate
    12/1/1985 12:00:00 AM
  • Firstpage
    541
  • Lastpage
    545
  • Abstract
    A new type of zero insertion force (ZIF) connector is proposed. In this new connector, the contact pair consists of an input/ output (I/O) pin and solder. An appropriate amount of solder fills cavities formed in the connector housing, and the position of the cavities corresponds with that of the I/O pins attached to the large-scale integration (LSI) module. The I/O pins are inserted or withdrawn, while the solder is melted. The possibility of this type of connector was examined using In-48%Sn (percent symbol stands for mass percent) solder and three kinds of surface finishes for the I/O pins; Au/Ni, Pd/Ni, and Au (very thin top layer)/Pd/Ni films. The solder was filled in the cavities formed in a glass-ceramic substrate, and electrical resistance between the I/O pin and solder was measured. A combination of the In48%Sn solder and Au/Pd/Ni film exhibits low electrical resistance even after many insertion/withdrawal cycles, indicating that these materials have suitable characteristics for the new type ZIF connector. A connector model using these materials shows low electrical resistance, below 10 m \\Omega after 50 insertion/withdrawal cycles. Experimental results indicate that the new type of connector has a high potential for use as a ZIF connector for future high-density pin grid array connections.
  • Keywords
    Component reliability; Connectors; Soldering; Connectors; Contacts; Electric resistance; Electrical resistance measurement; Gold; Large scale integration; Pins; Substrates; Surface finishing; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1985.1136531
  • Filename
    1136531