Title :
Fault detection in combinational networks by Reed-Muller transforms
Author :
Damarla, T. Raju ; Karpovsky, M.
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
fDate :
6/1/1989 12:00:00 AM
Abstract :
A new approach for fault detection in combinational networks based on Reed-Muller (RM) transforms is presented. An upper bound on the number of RM spectral coefficients required to be verified for detection of multiple stuck-at-faults and single bridging faults at the input lines of an n-input network is shown to be n. The time complexity (time required to test a network) for detection of multiple terminal faults and the storage required for storing the test are determined. An upper bound is found for the minimum number of test patterns required to detect a fault. The authors present standard tests based on this result, with a simple test generation procedure and upper bounds on minimal numbers of test patterns
Keywords :
combinatorial circuits; computational complexity; logic testing; Reed-Muller transforms; combinational networks; fault detection; multiple stuck-at-faults; single bridging faults; test generation; test patterns; time complexity; upper bound; Boolean functions; Data compression; Fault detection; Fault diagnosis; Hardware; Intelligent networks; Sparse matrices; Test pattern generators; Testing; Upper bound;
Journal_Title :
Computers, IEEE Transactions on