DocumentCode :
968600
Title :
Picosecond time-resolved laser mass spectroscopy
Author :
von der Linde, Dietrich ; Danielzik, Burkhard
Author_Institution :
Inst. fuer Laser- und Plasmaphys., Univ. GHS-Essen, West Germany
Volume :
25
Issue :
12
fYear :
1989
fDate :
12/1/1989 12:00:00 AM
Firstpage :
2540
Lastpage :
2549
Abstract :
The extension of laser mass spectroscopy to the picosecond time domain and the application of this method to the study of fast surface processes is described. The technique is based on a pump-probe scheme in which a first pulse stimulates the desorption of surface material, and a second delayed pulse is used to photoionize the desorbed particles to allow detection with a mass spectrometer. Measurements on picosecond-laser-heated GaAs surfaces demonstrate the feasibility of the method. For example, it was possible to measure the thermal desorption of Ga and of Ga2O with picosecond time resolution
Keywords :
III-V semiconductors; desorption; gallium arsenide; high-speed optical techniques; mass spectroscopic chemical analysis; mass spectroscopy; time resolved spectra; time resolved spectroscopy; Ga; Ga2O; GaAs; desorbed particles; fast surface processes; mass spectrometer; photoionize; picosecond time domain; picosecond time resolution; picosecond-laser-heated GaAs surfaces; pump-probe scheme; semiconductor; surface material desorption; thermal desorption; time-resolved laser mass spectroscopy; Atom lasers; Atomic beams; Atomic measurements; Chemical lasers; Mass spectroscopy; Optical materials; Optical pulses; Pump lasers; Surface emitting lasers; Surface treatment;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.40640
Filename :
40640
Link To Document :
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