DocumentCode :
968606
Title :
Theory of switching in polysilicon-n-p+ silicon structures
Author :
Board, K. ; Darwish, M.
Author_Institution :
University College of Swansea, Department of Electrical & Electronic Engineering, Swansea, UK
Volume :
17
Issue :
1
fYear :
1981
Firstpage :
41
Lastpage :
42
Abstract :
A simple theory is proposed for observed switching in polysilicon-n-p+ devices using a single grain for the polysilicon layer. The switching mechanism is similar to that in the tunnel oxide device but differs in that the conduction mechanism in the polysilicon is by thermionic emission rather than tunnelling. Alternative implementations are suggested using ion implantation, or molecular beam epitaxial gallium arsenide.
Keywords :
electrical conductivity transitions; elemental semiconductors; p-n homojunctions; semiconductor device models; semiconductor switches; silicon; GaAs; MBE; elemental semiconductors; ion implantation; model; poly Si-n-p+ devices; switching mechanism; thermionic emission;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19810030
Filename :
4245490
Link To Document :
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