DocumentCode
968635
Title
A study of two approaches for reconfiguring fault-tolerant systolic arrays
Author
Lam, C.W.H. ; Li, Hon F. ; Jayakumar, R.
Author_Institution
Dept. of Comput. Sci., Concordia Univ., Montreal, Que., Canada
Volume
38
Issue
6
fYear
1989
fDate
6/1/1989 12:00:00 AM
Firstpage
833
Lastpage
844
Abstract
Presents a critical study of two approaches, the classical RC-cut approach and H.T. Kung and M.S. Lam´s (Proc. 1984 MIT Conf. Advanced Res. VLSI p.74-83, 1984) RCS-cut approach, for reconfiguring faulty systolic arrays. The amount of cell (processing element) redundancy needed to ensure successful reconfiguration into an n ×n array is considered. It is shown that no polynomial bounded redundancy is sufficient for the classical approach, whereas O(n 2log n ) redundancy is sufficient for the Kung and Lams approach. The number of faulty cells that can be tolerated in a given array regardless of their locations is characterized and derived. It is shown that, for both approaches, in almost all cases a square array has better fault tolerance than a rectangular array having the same number of cells. A minimal fault pattern in a 2n ×2n array with 3n +1 faults that is not reconfigurable into an n ×n array using either of the two approaches is established
Keywords
cellular arrays; fault tolerant computing; redundancy; fault tolerance; faulty cells; faulty systolic arrays; minimal fault pattern; redundancy; square array; Circuit faults; Fabrication; Fault tolerance; Geometry; Pattern analysis; Polynomials; Process design; Redundancy; Systolic arrays; Very large scale integration;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/12.24292
Filename
24292
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