• DocumentCode
    968659
  • Title

    Thermal Characteristics of Beam-Lead Chips

  • Author

    Gower, Robert L.

  • Author_Institution
    Texas Instr., Inc.
  • Volume
    8
  • Issue
    2
  • fYear
    1972
  • fDate
    6/1/1972 12:00:00 AM
  • Firstpage
    39
  • Lastpage
    43
  • Abstract
    An experimental study of the thermal impedance characteristics of beam-lead chips is presented. A comparison of the thermal impedance of the 2N2222 and 2N3725 and the beam-lead equivalents of these devices is made. The beam-lead B2T2222 is used as a test vehicle to evaluate the effect of chip area, beam design, substrate temperature, and conformal coatings on the thermal impedance of beam-lead chips. Thermal impedance data for use in designing hybrid circuits with beam-lead devices are included.
  • Keywords
    Circuits; Coatings; Gold; Impedance; Instruments; Platinum; Semiconductor device measurement; Silicon; Substrates; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Parts, Hybrids, and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0361-1000
  • Type

    jour

  • DOI
    10.1109/TPHP.1972.1136567
  • Filename
    1136567