DocumentCode :
968664
Title :
DRAM macros for ASIC chips
Author :
Sunaga, Toshio ; Miyatake, Hisatada ; Kitamura, Koji ; Kasuya, Keishi ; Saitoh, Takaki ; Tanaka, Masahiro ; Tanigaki, Norio ; Mori, Yohtaro ; Yamasaki, Noritoshi
Author_Institution :
Yasu Technol. Application Lab., IBM Japan Ltd., Shigaken, Japan
Volume :
30
Issue :
9
fYear :
1995
fDate :
9/1/1995 12:00:00 AM
Firstpage :
1006
Lastpage :
1014
Abstract :
DRAM macros in 4-Mb (0.8-μm) and 16-Mb (0.5-μm) DRAM process technology generations have been developed for CMOS ASIC applications. The macros use the same area efficient one transistor trench cells as 4-Mb (SPT cell) and 16-R Mb (MINT cell) DRAM products. It is shown that the trench cells with capacitor plates by the grounded substrate are ideal structures as embedded DRAM´s. The trench cells built entirely under the silicon surface allow cost effective DRAM and CMOS logic merged process technologies. In the 0.8-μm rule, the DRAM macro has a 32-K×9-b configuration in a silicon area of 1.7×5.0 mm2 . It achieves a 27-ns access and a 50-ns cycle times. The other DRAM macro in the 0.5-μm technology is organized in 64 K×18 b. It has a macro area of 2.1×4.9 mm and demonstrated a 23-ns access and a 40-ns cycle times. Small densities and multiple bit data configurations provide a flexibility to ASIC designs and a wide variety of application capabilities. Multiple uses of the DRAM macros bring significant performance leverages to ASIC chips because of the wide data bus and the fast access and cycle times. A data rate more than 1.3 Gb/s is possible by a single chip. Some examples of actual DRAM macro embedded ASIC chips are shown
Keywords :
CMOS digital integrated circuits; DRAM chips; application specific integrated circuits; integrated circuit design; 0.5 micron; 0.8 micron; 1.3 Gbit/s; 16 Mbit; 23 to 50 ns; 4 Mbit; ASIC chips; CMOS ASIC applications; CMOS logic merged process technologies; DRAM macros; capacitor plates; grounded substrate; one transistor trench cells; Application specific integrated circuits; CMOS process; CMOS technology; Capacitors; Costs; Logic circuits; Random access memory; Silicon; Substrates; Transistors;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.406409
Filename :
406409
Link To Document :
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