• DocumentCode
    968673
  • Title

    Stability of Nickel-Chromium Thin Film Resistors

  • Author

    Ahern, James ; Heid, Kermit

  • Author_Institution
    Trans-A-File Systems,Sunnyvale, California
  • Volume
    8
  • Issue
    2
  • fYear
    1972
  • fDate
    6/1/1972 12:00:00 AM
  • Firstpage
    10
  • Lastpage
    13
  • Abstract
    This study explores the major factors which may affect the stability of thin film nickel-chromium resistors. These factors include annealing temperatures, manufacturing processes, form factors, power density, and trimming. The results of a 1000-hour load life study are given in terms of these same major factors.
  • Keywords
    Annealing; Assembly; Circuit testing; Manufacturing processes; Resistors; Stability; Substrates; Temperature; Transistors; Vacuum systems;
  • fLanguage
    English
  • Journal_Title
    Parts, Hybrids, and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0361-1000
  • Type

    jour

  • DOI
    10.1109/TPHP.1972.1136569
  • Filename
    1136569
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=968673