• DocumentCode
    968756
  • Title

    Analysis and Development of a Thermocompression Bond Schedule for Beam Lead Devices

  • Author

    Adams, J.R. ; Bonham, H.B.

  • Author_Institution
    Sandia Laboratories, Alberquerque, N. Mex.
  • Volume
    8
  • Issue
    3
  • fYear
    1972
  • fDate
    9/1/1972 12:00:00 AM
  • Firstpage
    22
  • Lastpage
    26
  • Abstract
    To obtain consistent and reliable beam lead device attachment by thermocompression bonding, it is necessary to determine an allowable range of bonding parameters over which the mechanical integrity of the device attachment is optimized. This paper discusses the practical considerations of beam lead wobble tool bonding, and describes the theoretical and experimental techniques which were used to establish the critical bonding variables. Using these techniques a bond schedule has been developed in terms of only two variables, bond force and interface temperature.
  • Keywords
    Area measurement; Bonding forces; Joining processes; Lead compounds; Metallization; Pollution measurement; Semiconductor devices; Semiconductor thin films; Temperature; Thin film devices;
  • fLanguage
    English
  • Journal_Title
    Parts, Hybrids, and Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0361-1000
  • Type

    jour

  • DOI
    10.1109/TPHP.1972.1136577
  • Filename
    1136577