DocumentCode
968756
Title
Analysis and Development of a Thermocompression Bond Schedule for Beam Lead Devices
Author
Adams, J.R. ; Bonham, H.B.
Author_Institution
Sandia Laboratories, Alberquerque, N. Mex.
Volume
8
Issue
3
fYear
1972
fDate
9/1/1972 12:00:00 AM
Firstpage
22
Lastpage
26
Abstract
To obtain consistent and reliable beam lead device attachment by thermocompression bonding, it is necessary to determine an allowable range of bonding parameters over which the mechanical integrity of the device attachment is optimized. This paper discusses the practical considerations of beam lead wobble tool bonding, and describes the theoretical and experimental techniques which were used to establish the critical bonding variables. Using these techniques a bond schedule has been developed in terms of only two variables, bond force and interface temperature.
Keywords
Area measurement; Bonding forces; Joining processes; Lead compounds; Metallization; Pollution measurement; Semiconductor devices; Semiconductor thin films; Temperature; Thin film devices;
fLanguage
English
Journal_Title
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0361-1000
Type
jour
DOI
10.1109/TPHP.1972.1136577
Filename
1136577
Link To Document