DocumentCode :
968756
Title :
Analysis and Development of a Thermocompression Bond Schedule for Beam Lead Devices
Author :
Adams, J.R. ; Bonham, H.B.
Author_Institution :
Sandia Laboratories, Alberquerque, N. Mex.
Volume :
8
Issue :
3
fYear :
1972
fDate :
9/1/1972 12:00:00 AM
Firstpage :
22
Lastpage :
26
Abstract :
To obtain consistent and reliable beam lead device attachment by thermocompression bonding, it is necessary to determine an allowable range of bonding parameters over which the mechanical integrity of the device attachment is optimized. This paper discusses the practical considerations of beam lead wobble tool bonding, and describes the theoretical and experimental techniques which were used to establish the critical bonding variables. Using these techniques a bond schedule has been developed in terms of only two variables, bond force and interface temperature.
Keywords :
Area measurement; Bonding forces; Joining processes; Lead compounds; Metallization; Pollution measurement; Semiconductor devices; Semiconductor thin films; Temperature; Thin film devices;
fLanguage :
English
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
0361-1000
Type :
jour
DOI :
10.1109/TPHP.1972.1136577
Filename :
1136577
Link To Document :
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