DocumentCode :
968778
Title :
t-TDA-diagnosable systems
Author :
Chu, S.-C. ; Armstrong, J.R.
Author_Institution :
Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume :
38
Issue :
6
fYear :
1989
fDate :
6/1/1989 12:00:00 AM
Firstpage :
914
Lastpage :
920
Abstract :
A testable diagnosis array (TDA) is proposed for carrying out system-level fault diagnosis (based on the PMC model) centrally and in a non-hard-core manner. This diagnostics device is constructed with simple reliable logic cells. A characterization of t-TDA-diagnosable systems, based on an algebraic relationship between the testing graph Tn of a system of n component and its corresponding TDA, is given. It is shown that the TDA performs the diagnosis correctly and reaches its stable state in a number of clock periods related to the t-diagnostic diameter of T. A special class of t-TDA-diagnosable systems is defined, and an example from that class is used to illustrate the diagnosability of a system using a TDA
Keywords :
fault location; fault tolerant computing; logic testing; TDA; diagnosability; diagnostics device; system-level fault diagnosis; testable diagnosis array; testing graph; Circuit faults; Clocks; Computer science; Fault diagnosis; Hardware; Logic arrays; Logic devices; Logic testing; Multiprocessing systems; System testing;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.24306
Filename :
24306
Link To Document :
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