Title :
Design of safety monitor schemes for a fault tolerant flight control system
Author :
Perhinschi, Mario G. ; Napolitano, Marcello R. ; Campa, Giampiero ; Seanor, Brad ; Burken, John ; Larson, Richard
Author_Institution :
Dept. of Mech. & Aerosp. Eng., West Virginia Univ., Morgantown, WV, USA
fDate :
4/1/2006 12:00:00 AM
Abstract :
For a research aircraft, "conventional" control laws (CLs) are implemented on a "baseline" flight computer (FC) while research CLs are typically housed on a dedicated research computer. Therefore, for an experimental aircraft used to test specific fault tolerant flight control systems, a safety logic scheme is needed to ensure a safe transition from conventional to research CLs (while at nominal conditions) as well as from research CLs at nominal conditions to conditions with "simulated" failures on specific control surfaces. This paper describes the design of such a safety scheme for the NASA Intelligent Flight Control System (IFCS) F-15 Program. The goals of the IFCS F-15 program are to investigate the performance of a set of fault tolerant CLs based on the use of dynamic inversion with neural augmentation. The different transitions are monitored using information relative to flight conditions and controller-related performance criteria. The testing of the scheme is performed with a Simulink-based flight simulation code and interface developed at West Virginia University for the NASA IFCS F-15 aircraft.
Keywords :
aerospace simulation; aerospace test facilities; aircraft control; fault tolerant computing; neural nets; safety systems; F-15 aircraft; IFCS F-15 program; NASA Intelligent Flight Control System; Simulink; West Virginia University; control laws; dynamic inversion; fault tolerant flight control systems; flight computer; flight simulation code; neural augmentation; research aircraft; safety logic scheme; safety monitor; Aerospace control; Aerospace safety; Aerospace simulation; Air safety; Aircraft; Computerized monitoring; Fault tolerant systems; Logic testing; NASA; System testing;
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
DOI :
10.1109/TAES.2006.1642572