Title :
Quantum mechanical simulation of charge transport in very small semiconductor structures
Author :
Yalabik, M.C. ; Neofotistos, G. ; Diff, Karim ; Guo, Hong ; Gunton, James D.
Author_Institution :
Dept. of Phys., Bilkent Univ., Ankara, Turkey
fDate :
6/1/1989 12:00:00 AM
Abstract :
A quantum-mechanical simulation method of charge transport in very small semiconductor devices is presented that is based on the numerical solution of the time-dependent Schrodinger equation (coupled self-consistently to the Poisson equation to determine the electrostatic potential in the device). Carrier transport is considered within the effective mass approximation, while the effects of the electron-phonon interaction are included in an approximation that is consistent with the results of the perturbation theory and gives the correct two-point time correlation function. Numerical results for the transient behaviour of a planar ultrasubmicrometer three-dimensional GaAs MESFETs (gate length of 26 nm) are also presented. They indicate that extremely fast gate-step response times (switching times) characterize such short-channel GaAs devices
Keywords :
III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; numerical methods; semiconductor device models; 26 nm; 3D models; GaAs transistors; Poisson equation; carrier transport; effective mass approximation; electron-phonon interaction; electrostatic potential; fast gate-step response times; gate length; numerical results; numerical solution; perturbation theory; planar; quantum-mechanical simulation method; semiconductors; short-channel GaAs devices; simulation of charge transport; submicron; switching times; three-dimensional GaAs MESFETs; time-dependent Schrodinger equation; transient behaviour; two-point time correlation function; ultrasubmicrometer; very small semiconductor devices; Charge carrier processes; Delay; Effective mass; Electrostatics; Gallium arsenide; MESFETs; Poisson equations; Quantum mechanics; Schrodinger equation; Semiconductor devices;
Journal_Title :
Electron Devices, IEEE Transactions on