DocumentCode :
968959
Title :
Transport and noise in GaAs/AlGaAs heterojunction bipolar transistors. I. Transport and high current gain
Author :
Day, Derek J. ; Jue, Shao Cheng ; Margittai, Agnes ; Houston, Peter A.
Author_Institution :
Bell-Northern Res., Ottawa, Ont., Canada
Volume :
36
Issue :
6
fYear :
1989
fDate :
6/1/1989 12:00:00 AM
Firstpage :
1015
Lastpage :
1019
Abstract :
A simple physical description of conduction and current grain in GaAs/AlGaAs double heterojunction n-p-n transistors is given using the barrier height, transport, and recombination processes that have been determined from the bias and temperature dependence of their forward characteristics. Gain saturation, high base resistance, and a gain creep process are explained in terms of band bending at the heterojunctions and its lowering by injection and collector bias. This description provides the foundation for interpretation of low-frequency noise and gain phenomena
Keywords :
III-V semiconductors; aluminium compounds; electrical conductivity of crystalline semiconductors and insulators; electron device noise; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; GaAs-AlGaAs; band bending; barrier height; bias dependence; carrier transport; collector bias; conduction; double heterojunction n-p-n transistors; forward characteristics; gain creep process; gain phenomena; gain saturation; heterojunction bipolar transistors; high base resistance; high current gain; interpretation; low-frequency noise; model; physical description; recombination processes; semiconductors; temperature dependence; Bipolar transistors; Creep; Current measurement; Double heterojunction bipolar transistors; Gallium arsenide; Helium; Heterojunction bipolar transistors; High-speed electronics; Spontaneous emission; Temperature dependence;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.24342
Filename :
24342
Link To Document :
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