• DocumentCode
    969028
  • Title

    Modeling of Plasma Probe Interactions With a PIC Code Using an Unstructured Mesh

  • Author

    Hilgers, Alain ; Clucas, Simon ; Thiébault, Benoit ; Roussel, Jean-Francois ; Matéo-Vélez, Jean-Charles ; Forest, Julien ; Rodgers, David

  • Author_Institution
    Eur. Space Res. & Technol. Centre, Eur. Space Agency, Noordwijk
  • Volume
    36
  • Issue
    5
  • fYear
    2008
  • Firstpage
    2319
  • Lastpage
    2323
  • Abstract
    A new Spacecraft Plasma Interaction Software has been developed in the frame of the Spacecraft Plasma Interaction Network (SPINE). This software is designed to simulate the kinetic processes of ions and electrons, taking into account their space charge and their interaction with spacecraft surfaces. It is freely available worldwide in open source. While the development and the qualification of the software functionalities were under the responsibility of a consortium led by ONERA under contract with the European Space Agency, the test and validation of the applicability of the code for solving problems in plasma physics remained under SPINE responsibility. The validation program includes step-by-step applications of the software to sheath modeling in simple geometry, artificial plasma injection, and spacecraft charging. We report here on the progress along this program, including Langmuir probe tests with spherical and cylindrical geometry and comparison with other numerical methods.
  • Keywords
    Langmuir probes; aerospace instrumentation; mesh generation; plasma sheaths; Langmuir probe tests; PIC code; artificial plasma injection; electron kinetic process; ions kinetic process; plasma probe interactions; sheath modeling; spacecraft charging; spacecraft plasma interaction network; spacecraft plasma interaction software; unstructured mesh; Langmuir probe; numerical techniques; particle-in-cell (PIC) plasma modeling; spacecraft charging;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2008.2003360
  • Filename
    4663123