DocumentCode
969265
Title
GaAs MESFET circuit simulation model including negative differential mobility
Author
Takada, Tatsuo ; Yokoyama, Kazuya ; Hirayama, Motoko
Author_Institution
NTT, Musashino Electrical Communication Laboratory, Musashino, Japan
Volume
17
Issue
3
fYear
1981
Firstpage
132
Lastpage
133
Abstract
A simple one-dimensional GaAs MESFET model for circuit simulation is presented which takes into account negative differential mobility. In this model, the drain current is derived from the electric field strength at the source side edge under the gate using a gradual depletion layer approximation. The calculated I/V characteristics agree well with the experimental data for GaAs power MESFETs, which show negative differential resistances. The proposed model can be used in computer aided design of GaAs integrated circuits and amplifiers with the great advantage of a small calculation time compared with that of 2-dimensional analysis.
Keywords
III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; semiconductor device models; GaAs MESFET model; I/V characteristics; III-V semiconductors; circuit simulation; computer aided design; depletion layer approximation; drain current; electric field strength; negative differential mobility;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19810094
Filename
4245556
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