• DocumentCode
    969265
  • Title

    GaAs MESFET circuit simulation model including negative differential mobility

  • Author

    Takada, Tatsuo ; Yokoyama, Kazuya ; Hirayama, Motoko

  • Author_Institution
    NTT, Musashino Electrical Communication Laboratory, Musashino, Japan
  • Volume
    17
  • Issue
    3
  • fYear
    1981
  • Firstpage
    132
  • Lastpage
    133
  • Abstract
    A simple one-dimensional GaAs MESFET model for circuit simulation is presented which takes into account negative differential mobility. In this model, the drain current is derived from the electric field strength at the source side edge under the gate using a gradual depletion layer approximation. The calculated I/V characteristics agree well with the experimental data for GaAs power MESFETs, which show negative differential resistances. The proposed model can be used in computer aided design of GaAs integrated circuits and amplifiers with the great advantage of a small calculation time compared with that of 2-dimensional analysis.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; semiconductor device models; GaAs MESFET model; I/V characteristics; III-V semiconductors; circuit simulation; computer aided design; depletion layer approximation; drain current; electric field strength; negative differential mobility;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19810094
  • Filename
    4245556