DocumentCode :
969417
Title :
Inductance measurements of superconducting chip-to-package connectors suitable for Josephson LSI technology
Author :
Jones, H.C. ; Herrell, D.J. ; Yao, Y.L.
Author_Institution :
IEEE TMAG
Volume :
15
Issue :
1
fYear :
1979
fDate :
1/1/1979 12:00:00 AM
Firstpage :
432
Lastpage :
434
Abstract :
It is necessary in any interconnection scheme used in LSI to be able to pass high-speed pulses from chip-to-chip through the package with a minimum of distortion while at the same time maximizing the number of input/output connectors (I/O´s) in large arrays of densely packed connectors. We have measured the inductances (both self and mutual) of chip-to-package connectors which were arranged in a peripheral row around the edge of the circuit chip. The largest self-inductance measured for an 8:1 ratio of I/O´s to ground connectors is low enough so that signals with a 30 ps time constant propagate through the connector without significant distortion. The largest self-inductance ranges from 28 pH for the linear array of eight connectors between grounds to 19 pH for four connectors between grounds. These results indicate that the electrical properties of these connectors are satisfactory for the LSI technology application of Josephson devices.
Keywords :
Inductance measurement; Integrated circuit interconnections; Interconnections, Integrated circuits; Josephson devices; Bonding; Connectors; Electric variables measurement; Equivalent circuits; Inductance measurement; Inductors; Large scale integration; Niobium; Superconducting transmission lines; Wiring;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1979.1060126
Filename :
1060126
Link To Document :
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