• DocumentCode
    969417
  • Title

    Inductance measurements of superconducting chip-to-package connectors suitable for Josephson LSI technology

  • Author

    Jones, H.C. ; Herrell, D.J. ; Yao, Y.L.

  • Author_Institution
    IEEE TMAG
  • Volume
    15
  • Issue
    1
  • fYear
    1979
  • fDate
    1/1/1979 12:00:00 AM
  • Firstpage
    432
  • Lastpage
    434
  • Abstract
    It is necessary in any interconnection scheme used in LSI to be able to pass high-speed pulses from chip-to-chip through the package with a minimum of distortion while at the same time maximizing the number of input/output connectors (I/O´s) in large arrays of densely packed connectors. We have measured the inductances (both self and mutual) of chip-to-package connectors which were arranged in a peripheral row around the edge of the circuit chip. The largest self-inductance measured for an 8:1 ratio of I/O´s to ground connectors is low enough so that signals with a 30 ps time constant propagate through the connector without significant distortion. The largest self-inductance ranges from 28 pH for the linear array of eight connectors between grounds to 19 pH for four connectors between grounds. These results indicate that the electrical properties of these connectors are satisfactory for the LSI technology application of Josephson devices.
  • Keywords
    Inductance measurement; Integrated circuit interconnections; Interconnections, Integrated circuits; Josephson devices; Bonding; Connectors; Electric variables measurement; Equivalent circuits; Inductance measurement; Inductors; Large scale integration; Niobium; Superconducting transmission lines; Wiring;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1979.1060126
  • Filename
    1060126