Title :
Transient Current Capacities of Bond Wires in Hybrid Microcircuits
Author :
Coxon, Moran ; Kershner, Charles ; Mceligot, Donald M.
Author_Institution :
Hughes Aircraft Company, Tuscon, AZ, USA
fDate :
9/1/1986 12:00:00 AM
Abstract :
The transient temperature behavior of short fine wires subjected to short-lived electrical pulses has been examined for application to bond wires in hybrid microcircuits. Closed-form solutions are presented for constant current pulses and are evaluated for simplified situations which neglect end conduction to the connections. Predictions are compared to fusing data for short wires. For application to design, it is recommended that results for two limiting conditions--steady-state specifications and transients without heat loss-be employed,
Keywords :
Aluminum integrated circuit conductors; Hybrid integrated-circuit bonding; Transient analysis; Aluminum; Bonding; Fuses; Gold; Heat transfer; Hybrid integrated circuits; Resistance heating; Steady-state; Temperature; Wires;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCHMT.1986.1136651