DocumentCode
969546
Title
Radiation damage - Neutron time bomb
Author
Jones, Rodri ; Chugg, Andrew
Volume
4
Issue
6
fYear
2006
Firstpage
30
Lastpage
33
Abstract
Hardware errors and failures caused by radiation are becoming significant threats to a growing range of systems. Electronics manufacturers and the engineering industry have been investing more and more in research into single-event effects in recent years in order to determine the impact on system reliability today and in the future, but there is still much work to be done. For high-reliability applications, single-event effect consideration and mitigation at the design phase has become increasingly important, and with the continuing trends in technology miniaturisation, such considerations are likely to become more important in the future
Keywords
electronic equipment manufacture; integrated circuit reliability; radiation hardening (electronics); electronics manufacture; engineering industry; hardware errors; radiation failures; single-event effects; system reliability; technology miniaturisation;
fLanguage
English
Journal_Title
Electronics Systems and Software
Publisher
iet
ISSN
1479-8336
Type
jour
Filename
4064886
Link To Document