DocumentCode :
969546
Title :
Radiation damage - Neutron time bomb
Author :
Jones, Rodri ; Chugg, Andrew
Volume :
4
Issue :
6
fYear :
2006
Firstpage :
30
Lastpage :
33
Abstract :
Hardware errors and failures caused by radiation are becoming significant threats to a growing range of systems. Electronics manufacturers and the engineering industry have been investing more and more in research into single-event effects in recent years in order to determine the impact on system reliability today and in the future, but there is still much work to be done. For high-reliability applications, single-event effect consideration and mitigation at the design phase has become increasingly important, and with the continuing trends in technology miniaturisation, such considerations are likely to become more important in the future
Keywords :
electronic equipment manufacture; integrated circuit reliability; radiation hardening (electronics); electronics manufacture; engineering industry; hardware errors; radiation failures; single-event effects; system reliability; technology miniaturisation;
fLanguage :
English
Journal_Title :
Electronics Systems and Software
Publisher :
iet
ISSN :
1479-8336
Type :
jour
Filename :
4064886
Link To Document :
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