• DocumentCode
    969546
  • Title

    Radiation damage - Neutron time bomb

  • Author

    Jones, Rodri ; Chugg, Andrew

  • Volume
    4
  • Issue
    6
  • fYear
    2006
  • Firstpage
    30
  • Lastpage
    33
  • Abstract
    Hardware errors and failures caused by radiation are becoming significant threats to a growing range of systems. Electronics manufacturers and the engineering industry have been investing more and more in research into single-event effects in recent years in order to determine the impact on system reliability today and in the future, but there is still much work to be done. For high-reliability applications, single-event effect consideration and mitigation at the design phase has become increasingly important, and with the continuing trends in technology miniaturisation, such considerations are likely to become more important in the future
  • Keywords
    electronic equipment manufacture; integrated circuit reliability; radiation hardening (electronics); electronics manufacture; engineering industry; hardware errors; radiation failures; single-event effects; system reliability; technology miniaturisation;
  • fLanguage
    English
  • Journal_Title
    Electronics Systems and Software
  • Publisher
    iet
  • ISSN
    1479-8336
  • Type

    jour

  • Filename
    4064886