DocumentCode
969575
Title
A low-noise low-offset capacitive sensing amplifier for a 50-μg/√Hz monolithic CMOS MEMS accelerometer
Author
Wu, Jiangfeng ; Fedder, Gary K. ; Carley, L. Richard
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume
39
Issue
5
fYear
2004
fDate
5/1/2004 12:00:00 AM
Firstpage
722
Lastpage
730
Abstract
This paper describes a CMOS capacitive sensing amplifier for a monolithic MEMS accelerometer fabricated by post-CMOS surface micromachining. This chopper stabilized amplifier employs capacitance matching with optimal transistor sizing to minimize sensor noise floor. Offsets due to sensor and circuit are reduced by ac offset calibration and dc offset cancellation based on a differential difference amplifier (DDA). Low-duty-cycle periodic reset is used to establish robust dc bias at the sensing electrodes with low noise. This work shows that continuous-time voltage sensing can achieve lower noise than switched-capacitor charge integration for sensing ultra-small capacitance changes. A prototype accelerometer integrated with this circuit achieves 50-μg/√Hz acceleration noise floor and 0.02-aF/√Hz capacitance noise floor while chopped at 1 MHz.
Keywords
CMOS integrated circuits; accelerometers; capacitive sensors; choppers (circuits); differential amplifiers; micromachining; micromechanical devices; microsensors; 1 MHz; CMOS MEMS accelerometer; CMOS capacitive sensing amplifier; ac offset calibration; capacitance changes sensing; capacitance matching; capacitive sensing amplifier; chopper stabilization; chopper stabilized amplifier; continuous-time voltage sensing; dc offset cancellation; differential difference amplifier; low-duty-cycle periodic reset; low-noise capacitive sensing amplifier; low-offset capacitive sensing amplifier; microelectromechanical systems; monolithic MEMS acceloremeter; optimal transistor sizing; post-CMOS surface micromachining; robust dc bias; sensing electrodes; sensor noise floor minimization; switched-capacitor charge integration; Accelerometers; Calibration; Capacitance; Capacitive sensors; Choppers; Circuit noise; Low-noise amplifiers; Micromachining; Micromechanical devices; Noise cancellation;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2004.826329
Filename
1291677
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