DocumentCode :
969575
Title :
A low-noise low-offset capacitive sensing amplifier for a 50-μg/√Hz monolithic CMOS MEMS accelerometer
Author :
Wu, Jiangfeng ; Fedder, Gary K. ; Carley, L. Richard
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
39
Issue :
5
fYear :
2004
fDate :
5/1/2004 12:00:00 AM
Firstpage :
722
Lastpage :
730
Abstract :
This paper describes a CMOS capacitive sensing amplifier for a monolithic MEMS accelerometer fabricated by post-CMOS surface micromachining. This chopper stabilized amplifier employs capacitance matching with optimal transistor sizing to minimize sensor noise floor. Offsets due to sensor and circuit are reduced by ac offset calibration and dc offset cancellation based on a differential difference amplifier (DDA). Low-duty-cycle periodic reset is used to establish robust dc bias at the sensing electrodes with low noise. This work shows that continuous-time voltage sensing can achieve lower noise than switched-capacitor charge integration for sensing ultra-small capacitance changes. A prototype accelerometer integrated with this circuit achieves 50-μg/√Hz acceleration noise floor and 0.02-aF/√Hz capacitance noise floor while chopped at 1 MHz.
Keywords :
CMOS integrated circuits; accelerometers; capacitive sensors; choppers (circuits); differential amplifiers; micromachining; micromechanical devices; microsensors; 1 MHz; CMOS MEMS accelerometer; CMOS capacitive sensing amplifier; ac offset calibration; capacitance changes sensing; capacitance matching; capacitive sensing amplifier; chopper stabilization; chopper stabilized amplifier; continuous-time voltage sensing; dc offset cancellation; differential difference amplifier; low-duty-cycle periodic reset; low-noise capacitive sensing amplifier; low-offset capacitive sensing amplifier; microelectromechanical systems; monolithic MEMS acceloremeter; optimal transistor sizing; post-CMOS surface micromachining; robust dc bias; sensing electrodes; sensor noise floor minimization; switched-capacitor charge integration; Accelerometers; Calibration; Capacitance; Capacitive sensors; Choppers; Circuit noise; Low-noise amplifiers; Micromachining; Micromechanical devices; Noise cancellation;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2004.826329
Filename :
1291677
Link To Document :
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