DocumentCode
969714
Title
Rapidly Solidified Soft Solder Die-Attach Technology
Author
Pinamaneni, SubbaRao ; Solomon, David A.
Author_Institution
National Semiconductors, CA
Volume
9
Issue
4
fYear
1986
fDate
12/1/1986 12:00:00 AM
Firstpage
416
Lastpage
422
Abstract
Soft solders used in the die-attach of power packages are prone to fatigue failure. Conventionally east soft solders typically contain nonhomogeneous Phases and organics. Failure analysis usually shows extensive voids, cracks, and segregation of metals in the die-attach medium, which leads to increased thermal resistance and catastrophic failure during power cycling. Soft solders manufactured via rapid solidification are formed into ribbon directly from the molten metal. The microstructure is homogeneous and free from organics. A study was performed to establish an optimum die-attach process utilizing rapidly solidified soft solder and tO quantify the reliability improvement.
Keywords
Power semiconductor devices; Semiconductor device bonding; Capacitive sensors; Costs; Electronic packaging thermal management; Fatigue; Lead; Plastics; Temperature; Testing; Thermal resistance; Thermal stresses;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1986.1136671
Filename
1136671
Link To Document