• DocumentCode
    969714
  • Title

    Rapidly Solidified Soft Solder Die-Attach Technology

  • Author

    Pinamaneni, SubbaRao ; Solomon, David A.

  • Author_Institution
    National Semiconductors, CA
  • Volume
    9
  • Issue
    4
  • fYear
    1986
  • fDate
    12/1/1986 12:00:00 AM
  • Firstpage
    416
  • Lastpage
    422
  • Abstract
    Soft solders used in the die-attach of power packages are prone to fatigue failure. Conventionally east soft solders typically contain nonhomogeneous Phases and organics. Failure analysis usually shows extensive voids, cracks, and segregation of metals in the die-attach medium, which leads to increased thermal resistance and catastrophic failure during power cycling. Soft solders manufactured via rapid solidification are formed into ribbon directly from the molten metal. The microstructure is homogeneous and free from organics. A study was performed to establish an optimum die-attach process utilizing rapidly solidified soft solder and tO quantify the reliability improvement.
  • Keywords
    Power semiconductor devices; Semiconductor device bonding; Capacitive sensors; Costs; Electronic packaging thermal management; Fatigue; Lead; Plastics; Temperature; Testing; Thermal resistance; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1986.1136671
  • Filename
    1136671