DocumentCode
969765
Title
Noncontact Bent Pin Detection Using Laser Diffraction
Author
Voyles, Richard M., Jr.
Author_Institution
IBM Corporation, NY
Volume
9
Issue
4
fYear
1986
fDate
12/1/1986 12:00:00 AM
Firstpage
458
Lastpage
463
Abstract
The use of optical diffraction is investigated to detect bent pins on a high-density multi-chip integrated-circuit module as an intermediate step in a robotic assembly process. A fixed laser beam shines on a fixed optical array while the robot moves the pins of the module through the beam at four different orientations. (While two scans are mathematically adequate, four scans are required because of the physical characteristics of this particular module.) The optical array is continuously scanned and the resultant images are processed to detect specific abnormalities in the diffraction pattern. If a flaw is detected, software determines the approximate location of the defective pin and whether it should be straightened manually or sent back for rework (determined by the angle of bend).
Keywords
Inspection; Laser applications, measurement; Optical diffraction; Humans; Laser beams; Laser theory; Optical arrays; Optical diffraction; Optical sensors; Pins; Robotic assembly; Robots; Sockets;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1986.1136677
Filename
1136677
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