DocumentCode :
969819
Title :
Translucent A1N Ceramic Substrate
Author :
Kuramoto, Nobuyuki ; Taniguchi, Hitofumi ; Aso, Isao
Author_Institution :
Tokuyama Soda Co., Ltd., Fujisawa Research Laboratory, Japan
Volume :
9
Issue :
4
fYear :
1986
fDate :
12/1/1986 12:00:00 AM
Firstpage :
386
Lastpage :
390
Abstract :
A translucent aluminum nitride (AlN) substrate has recently come into the market which has a thermal conductivity of 140 W/mK at room temperature and 130 W/mK at 100°C, eight times that of alumina (Al2O3) and one-half to two-thirds that of beryllia (BeO). Its excellent electrical and mechanical properties as well as inherent light transmitting property ensure that the new AlN material can be used as high-performance ceramic substrates for high-power and high-speed semiconductor modules. Metallization of the ceramic has been done by three methods: 1) tungsten metallization by a co-firing process, which is a fundamental technology for the coming multilayer AlN packages; 2) metallization with silver-palladium (Ag/Pd) conductor and ruthenium-oxide (RuO2) resistor, which was developed for the translucent AlN substrate; and 3) molten metal metallization, which gives very high adhesive strength. Development of an improved AlN ceramic with a thermal conductivity exceeding that of BeO is also described.
Keywords :
Integrated circuit packaging; Power semiconductor devices; Aluminum nitride; Ceramics; Conducting materials; Mechanical factors; Metallization; Semiconductor materials; Substrates; Temperature; Thermal conductivity; Tungsten;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/TCHMT.1986.1136682
Filename :
1136682
Link To Document :
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