• DocumentCode
    969819
  • Title

    Translucent A1N Ceramic Substrate

  • Author

    Kuramoto, Nobuyuki ; Taniguchi, Hitofumi ; Aso, Isao

  • Author_Institution
    Tokuyama Soda Co., Ltd., Fujisawa Research Laboratory, Japan
  • Volume
    9
  • Issue
    4
  • fYear
    1986
  • fDate
    12/1/1986 12:00:00 AM
  • Firstpage
    386
  • Lastpage
    390
  • Abstract
    A translucent aluminum nitride (AlN) substrate has recently come into the market which has a thermal conductivity of 140 W/mK at room temperature and 130 W/mK at 100°C, eight times that of alumina (Al2O3) and one-half to two-thirds that of beryllia (BeO). Its excellent electrical and mechanical properties as well as inherent light transmitting property ensure that the new AlN material can be used as high-performance ceramic substrates for high-power and high-speed semiconductor modules. Metallization of the ceramic has been done by three methods: 1) tungsten metallization by a co-firing process, which is a fundamental technology for the coming multilayer AlN packages; 2) metallization with silver-palladium (Ag/Pd) conductor and ruthenium-oxide (RuO2) resistor, which was developed for the translucent AlN substrate; and 3) molten metal metallization, which gives very high adhesive strength. Development of an improved AlN ceramic with a thermal conductivity exceeding that of BeO is also described.
  • Keywords
    Integrated circuit packaging; Power semiconductor devices; Aluminum nitride; Ceramics; Conducting materials; Mechanical factors; Metallization; Semiconductor materials; Substrates; Temperature; Thermal conductivity; Tungsten;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1986.1136682
  • Filename
    1136682