• DocumentCode
    969868
  • Title

    Effect of Bromine in Molding Compounds on Gold - Aluminum Bonds

  • Author

    Ahmad, Syed Sajid ; Blish, Richard C., II ; Corbett, Timothy J. ; King, Jerrold L. ; Shirley, C. Glenn

  • Author_Institution
    Intel Corp., AZ
  • Volume
    9
  • Issue
    4
  • fYear
    1986
  • fDate
    12/1/1986 12:00:00 AM
  • Firstpage
    379
  • Lastpage
    385
  • Abstract
    Degradation rates of gold wire ball bonds on aluminum bonding pads were studied in two molding compounds as a function of bromine concentration, temperature, and time at temperature. The measure of degradation was the resistance increase of the aluminum-gold contact. The rate of degradation was observed to increase with increasing bromine content and temperature for both molding compounds. However, the bromine content dependence of the activation free energy of the degradation reaction indicates a different degradation mechanism for each molding compound.
  • Keywords
    Fires; Integrated circuit bonding; Integrated circuit reliability; Aluminum; Bonding; Degradation; Electrical resistance measurement; Gold; Kelvin; Pins; Semiconductor device measurement; Temperature; Wire;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/TCHMT.1986.1136687
  • Filename
    1136687