DocumentCode
969868
Title
Effect of Bromine in Molding Compounds on Gold - Aluminum Bonds
Author
Ahmad, Syed Sajid ; Blish, Richard C., II ; Corbett, Timothy J. ; King, Jerrold L. ; Shirley, C. Glenn
Author_Institution
Intel Corp., AZ
Volume
9
Issue
4
fYear
1986
fDate
12/1/1986 12:00:00 AM
Firstpage
379
Lastpage
385
Abstract
Degradation rates of gold wire ball bonds on aluminum bonding pads were studied in two molding compounds as a function of bromine concentration, temperature, and time at temperature. The measure of degradation was the resistance increase of the aluminum-gold contact. The rate of degradation was observed to increase with increasing bromine content and temperature for both molding compounds. However, the bromine content dependence of the activation free energy of the degradation reaction indicates a different degradation mechanism for each molding compound.
Keywords
Fires; Integrated circuit bonding; Integrated circuit reliability; Aluminum; Bonding; Degradation; Electrical resistance measurement; Gold; Kelvin; Pins; Semiconductor device measurement; Temperature; Wire;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/TCHMT.1986.1136687
Filename
1136687
Link To Document