The Basic Reactions, Compositions, and Electrical Properties of Pd-Ag Thick-Film Resistors

The basic reactions, compositions, and electrical properties of glazed Pd-Ag sintered layers through a firing process have been examined by differential thermal analysis, thermograviometric analysis, and X-ray diffraction analysis. The evaporation and combustion of screening vehicle and solvents, the oxidation-reduction behaviors of Pd and Ag the creation of PdAg solid solution, and the electrical properties and stability of these resistors have been studied. From these tests it was found that the degree of process sensitivity for these resistors was high, and electrical properties and stability of these resistors were affected in much the same way by firing temperature and firing period. They were influenced most by temperature rise rate and least by temperature fall rate.