Title :
Mechanism of Aging in Pd-Ag Thick-Film Resistors
Author :
Taketa, Yoshiaki ; Haradome, Miyoshi
Author_Institution :
Nihon Univ., Japan
fDate :
6/1/1973 12:00:00 AM
Abstract :
Accelerated life tests under elevated temperarure, high humidity, and vacuum have been conducted on Pd-Ag thick-film resistors It is found that the change of resistance under those accelerated life test conditions is mainly caused by oxidation and reduction of the electrically conductive components (Pd and Ag) of Pd-Ag thick-film resistors. Through life tests in vacuum, the effect of adsorption was found to be less important than the structural change inside the resistor.
Keywords :
Life testing; Thick-film resistors; Aging; Fabrication; Firing; Glass; Life estimation; Life testing; Oxidation; Printing; Resistors; Temperature;
Journal_Title :
Parts, Hybrids, and Packaging, IEEE Transactions on
DOI :
10.1109/TPHP.1973.1136716
