Microwave properties of variable thin-film Josephson bridges

Amplification, down-conversion and detection of the microwaves in thin-film Josephson variable thickness bridges of submicron dimensions have been investigated experimentally. The results for indium and tin bridges are discussed taking into account the influence of the nonequilibrium electrons in a weak link region. The same experiments were carried out with SNS variable thickness Nb-Al-Nb bridges. They showed that the properties of SNS bridges agreed better with the theoretical predictions of the resistively shunted junction model in a wide temperature range. Moreover the parameters of the Nb-Al-Nb bridges have possessed better stability and reliability.