Title :
Low frequency impedance and noise properties of an RF biased resistive SQUID
Author :
Giffard, R.P. ; Michelson, P.F. ; Soulen, R.J., Jr.
Author_Institution :
Stanford University, Stanford, CA
fDate :
1/1/1979 12:00:00 AM
Abstract :
A noise thermometer consisting of a nonhysteretic resistive SQUID has been used for unusually precise measurements of the low frequency Josephson linewidth of a heavily shunted point-contact. The results agree with theories appropriate for weak links, and support the contention that the pair fluctuation noise calculated for tunnel junctions is not present in point-contacts.
Keywords :
Josephson device measurement applications; Temperature measurements; Circuit noise; Impedance; Josephson junctions; Low-frequency noise; NIST; Noise measurement; Radio frequency; SQUIDs; Temperature; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1979.1060212
