• DocumentCode
    970420
  • Title

    Current testability analysis of feedback bridging faults in CMOS circuits

  • Author

    Roca, Miquel ; Rubio, Antonio

  • Author_Institution
    Dept. of Phys., Univ. Illes Balears, Palma de Mallorca, Spain
  • Volume
    14
  • Issue
    10
  • fYear
    1995
  • fDate
    10/1/1995 12:00:00 AM
  • Firstpage
    1299
  • Lastpage
    1305
  • Abstract
    An exhaustive classification of bridging faults between pairs of logic level circuit nodes and an IDDQ testability analysis scheme for these faults are presented in this paper. The case of feedback bridging faults producing oscillations is considered in detail. The testability of such faults is verified through a set of experiments with specially implemented ASIC´s
  • Keywords
    CMOS logic circuits; application specific integrated circuits; circuit feedback; circuit oscillations; fault diagnosis; integrated circuit testing; logic testing; ASIC; CMOS circuits; IDDQ testability analysis scheme; current testability analysis; feedback bridging faults; logic level circuit nodes; oscillations; Bridge circuits; CMOS digital integrated circuits; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Energy consumption; Feedback circuits; Logic circuits; Logic testing;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.466345
  • Filename
    466345
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=970420