Design of an Operational Amplifier Input Stage Immune to EMI

Author

Fiori, Franco

Author_Institution

Politecnico di Torino, Turin

Volume

49

Issue

4

fYear

2007

Firstpage

834

Lastpage

839

Abstract

This paper presents a new analytical model to predict upsets, which are induced by electromagnetic interferences (EMI) in CMOS operational amplifiers (opamps). In particular, it is pointed out that the demodulation of EMI, which is experienced in feedback CMOS opamps, is related to the power spectral density of the interfering signals reaching the opamp input terminals. Furthermore, the new model is employed to design a differential stage immune to EMI.

Keywords

CMOS integrated circuits; demodulation; electromagnetic interference; integrated circuit design; operational amplifiers; CMOS integrated circuit; CMOS operational amplifier design; electromagnetic interference demodulation; electromagnetic susceptibility; feedback CMOS opamp; power spectral density; Analytical models; Demodulation; Electromagnetic compatibility; Electromagnetic interference; Feedback; Immunity testing; Operational amplifiers; Radiofrequency interference; Semiconductor device modeling; Voltage; Electromagnetic interference (EMI); electromagnetic susceptibility; integrated circuits; nonlinear model; operational amplifier;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2007.908255

Filename

4380417