Title :
Design of an Operational Amplifier Input Stage Immune to EMI
Author_Institution :
Politecnico di Torino, Turin
Abstract :
This paper presents a new analytical model to predict upsets, which are induced by electromagnetic interferences (EMI) in CMOS operational amplifiers (opamps). In particular, it is pointed out that the demodulation of EMI, which is experienced in feedback CMOS opamps, is related to the power spectral density of the interfering signals reaching the opamp input terminals. Furthermore, the new model is employed to design a differential stage immune to EMI.
Keywords :
CMOS integrated circuits; demodulation; electromagnetic interference; integrated circuit design; operational amplifiers; CMOS integrated circuit; CMOS operational amplifier design; electromagnetic interference demodulation; electromagnetic susceptibility; feedback CMOS opamp; power spectral density; Analytical models; Demodulation; Electromagnetic compatibility; Electromagnetic interference; Feedback; Immunity testing; Operational amplifiers; Radiofrequency interference; Semiconductor device modeling; Voltage; Electromagnetic interference (EMI); electromagnetic susceptibility; integrated circuits; nonlinear model; operational amplifier;
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
DOI :
10.1109/TEMC.2007.908255
