DocumentCode :
970471
Title :
Characterization of Nb3 Sn diffusion layer (A-15) material
Author :
Diadiuk, V. ; Bostock, J. ; MacVicar, M.L.A.
Author_Institution :
Lincoln Lab., M.I.T., Lexington, MA, USA
Volume :
15
Issue :
1
fYear :
1979
fDate :
1/1/1979 12:00:00 AM
Firstpage :
610
Lastpage :
612
Abstract :
Microstructural characterization of Nb3 Sn diffusion layers grown by Sn-vapor reaction with single crystal Nb substrates has been carried out using Auger and X-ray spectroscopy, X-ray and reflection electron diffractometry, and scanning electron microscopy. The layers exhibit preferred crystallographic orientation traceable to the underlying Nb-substrate orientation. The 
-Nb-substrate layers differ substantially from all other-Nb-direction layers. In particular, they exhibit surface-like composition profiles over several hundred angstroms into the bulk, a very rough micro-structure including numerous microcracks, and a surface superconducting transition temperature of < 1 K. Non- -Nb-substrate layers with 1 μm columnar grain structure and surface Tc \´s ∼ 18 K appear to have breaking stresses far in excess of bulk polycrystalline Nb3 Sn.
-Nb-substrate layers differ substantially from all other-Nb-direction layers. In particular, they exhibit surface-like composition profiles over several hundred angstroms into the bulk, a very rough micro-structure including numerous microcracks, and a surface superconducting transition temperature of < 1 K. Non- -Nb-substrate layers with 1 μm columnar grain structure and surface TKeywords :
Superconducting materials; Crystal microstructure; Crystallography; Niobium; Reflection; Rough surfaces; Scanning electron microscopy; Spectroscopy; Surface roughness; Tin; X-ray diffraction;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1979.1060219
Filename :
1060219
Link To Document :
