Characterization of a resistive half plane over a resistive sheet

Author

Natzke, John R. ; Volaki, John L.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA

Volume

41

Issue

8

fYear

1993

fDate

8/1/1993 12:00:00 AM

Firstpage

1063

Lastpage

1068

Abstract

The diffraction of a resistive half plane over a planar resistive sheet under plane wave illumination is determined via the dual integral equation method (a variation of the Wiener-Hopf method). The solution is obtained by splitting the associated Wiener-Hopf functions via a numerically efficient routine. Based on the derived exact half plane diffraction coefficient, a simplified equivalent model of the structure is developed when the separation of the half-plane and resistive plane is on the order of a tenth of a wavelength or less. The model preserves the geometrical optics field of the original structure for all angles and is based on an approximate image theory of the resistive plane. Good agreement is obtained with the diffracted field exact solution

Keywords

electromagnetic wave diffraction; geometrical optics; integral equations; Wiener-Hopf method; approximate image theory; dual integral equation method; electromagnetic diffraction; equivalent model; exact half plane diffraction coefficient; geometrical optics; numerically efficient routine; planar resistive sheet; plane wave illumination; resistive half plane; Conductivity; Dielectric substrates; Geometrical optics; Geometry; Helium; Integral equations; Lighting; Optical diffraction; Radar cross section; Solid modeling;

fLanguage

English

Journal_Title

Antennas and Propagation, IEEE Transactions on

Publisher

ieee

ISSN

0018-926X

Type

jour

DOI

10.1109/8.244647

Filename

244647