DocumentCode
971075
Title
Low-frequency noise spectrum of GaAs FETs
Author
Graffeuil, J.
Author_Institution
CNRS, Laboratoire d´Automatique et d´Analyse des Systÿmes, Toulouse, France
Volume
17
Issue
11
fYear
1981
Firstpage
387
Lastpage
388
Abstract
In GaAs MESFETs low-frequency noise spectra of various forms are observed. In some cases they are of the form (A/f) {1¿(2/¿) tan¿1 (¿¿0)}. The bias dependence of A and ¿0 is attributed to the variation in channel thickness. Usefulness of low-frequency spectra for MESFET design and application is outlined.
Keywords
III-V semiconductors; Schottky gate field effect transistors; electron device noise; gallium arsenide; semiconductor device models; GaAs MESFETs; bias dependence; low-frequency noise spectra;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19810271
Filename
4245741
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