Title :
Precise delay/phase measurement using surface-acoustic waves and microprocessing
Author_Institution :
Lockheed Palo Alto Research Laboratory, Palo Alto, USA
Abstract :
A new type of delay or phase measurement device using surface-acoustic waves is described. Test data are shown which indicate an RMS error of 0.18 degrees over a complete cycle of phase.
Keywords :
delays; phase measurement; surface acoustic wave devices; RMS error; SAWD; delay/phase measurement device; microprocessing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810290
