• DocumentCode
    971816
  • Title

    Separation of bulk lifetime and surface recombination velocity by multiwavelength technique

  • Author

    Sirleto, L. ; Irace, A. ; Vitale, G.F. ; Zeni, L. ; Cutolo, A.

  • Author_Institution
    IRECE-Res. Inst. for Electromagnetism & Electron. Components, CNR, Napoli, Italy
  • Volume
    38
  • Issue
    25
  • fYear
    2002
  • fDate
    12/5/2002 12:00:00 AM
  • Firstpage
    1742
  • Lastpage
    1743
  • Abstract
    A contactless, all-optical and nondestructive technique for simultaneous measurement of minority carrier recombination lifetime and surface recombination velocity, at low injection level, in silicon samples is presented. Being contactless and non-destructive with respect to the surface to be analysed, the method is appealing for routine lifetime characterisation.
  • Keywords
    carrier lifetime; elemental semiconductors; minority carriers; nondestructive testing; silicon; surface recombination; Si; all-optical technique; bulk lifetime; contactless technique; minority carrier recombination lifetime; multiwavelength technique; nondestructive technique; routine lifetime characterisation; silicon; surface recombination velocity;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20021109
  • Filename
    1137501
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=971816