Title :
Reply: Equivalent network analysis of dielectric thin-film waveguide with trapezoidal cross-section
Author :
Koshiba, Masanori ; Suzuki, M.
Author_Institution :
Hokkaido University, Department of Electronic Engineering, Faculty of Engineering, Sapporo, Japan
Keywords :
carrier density; heat sinks; optical modulation; semiconductor junction lasers; thermal diffusion; thermal resistance; carrier density change; current-modulated semiconductor lasers; frequency shift; heat sink thermal resistance; thermal diffusion; time dependent thermal effects;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810346
