Title :
New technique for determination of static emitter and collector series resistances of bipolar transistors
Author :
Filensky, W. ; Beneking, H.
Author_Institution :
Aachen Technical University, Institute of Semiconductor Electronics, Aachen, West Germany
Abstract :
Starting with detailed investigations of the IC/VCE characteristics in the vicinity of the origin it is shown how the static emitter and collector series resistances of bipolar transistors can simply be determined using a curve tracer. Experimental results demonstrate the efficiency of this technique.
Keywords :
bipolar transistors; electric resistance measurement; semiconductor device testing; IC/VCE characteristics; bipolar transistors; collector series resistances; curve tracer; static emitter series resistance; test method;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810352
