DocumentCode :
971958
Title :
VLSI test system [New Products]
Volume :
12
Issue :
3
fYear :
1995
Firstpage :
9
Keywords :
Automatic testing; Built-in self-test; Control system synthesis; EPROM; Emulation; Pricing; Read-write memory; Software testing; System testing; Very large scale integration;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1995.466361
Filename :
466361
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=971958
