Title :
Characteristics of Cr Schottky amorphous silicon photodiodes and their application to linear image sensors
Author :
Kakinuma, Hiroaki ; Sakamoto, Masaaki ; Kasuya, Yukio ; Sawai, Hideo
Author_Institution :
Oki Electr. Ind. Co. Ltd., Tokyo, Japan
fDate :
1/1/1990 12:00:00 AM
Abstract :
Cr Schottky amorphous silicon (a-Si:H) photodiodes with a configuration of Cr/a-Si:H tin-doped indium oxide (ITO), where Cr is negatively biased with respect to ITO in contrast to the conventional bias direction, were characterized to provide simple and stable sensor elements for economical linear image sensors. It was found that the barrier height of the Cr/a-Si:H junction is sufficiently high (0.89 eV) to prevent electron injection and that the junction is thermally stable. The transport properties of holes propagating in the a-Si:H layer were largely improved by a few parts per million boron doping, and as a result saturation of the photocurrent was achieved. A contact-type ISO A4, 8-dot/mm linear range sensor was fabricated using the Cr Schottky photodiode array. The sensor showed excellent characteristics for use in G3 facsimile
Keywords :
Schottky-barrier diodes; amorphous semiconductors; chromium; elemental semiconductors; hydrogen; image sensors; photodiodes; silicon; 0.89 eV; Cr Schottky photodiode array; Cr-ITO-Si:H; Cr-InSnO-Si:H; G3 facsimile; Si:H,B; amorphous Si:H photodiodes; contact-type ISO A4; economical linear image sensors; electron injection; hole transport properties; junction barrier height; linear range sensor; negatively biased Cr; photocurrent saturation; stable sensor elements; thermal stability; Amorphous silicon; Boron; Chromium; Doping; Electrons; Image sensors; Indium tin oxide; Photodiodes; Sensor arrays; Sensor phenomena and characterization;
Journal_Title :
Electron Devices, IEEE Transactions on