Title :
Alternating beam method (ABM) in photothermal microscopy (PTM) and photoacoustic microscopy (PAM)
Author :
Lehto, A. ; Jokinen, Markku ; Jaarinen, J. ; Tiusanen, T. ; Luukkala, M.
Author_Institution :
University of Helsinki, Department of Physics, Helsinki, Finland
Abstract :
In measuring thermal properties of nearly uniform surfaces, it is often difficult to resolve small differences in the surfaces. The letter reports a differential method to measure small variations with the detector operating as a null detector. This method is applied to measure the thickness of plasma-sprayed coatings.
Keywords :
acoustic microscopes; photoacoustic effect; thickness measurement; alternating beam method; differential method; null detector; photoacoustic microscopy; photothermal microscopy; plasma-sprayed coatings; thickness measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810378
